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author | Roman Lebedev <lebedev.ri@gmail.com> | 2018-07-13 16:14:37 +0000 |
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committer | Roman Lebedev <lebedev.ri@gmail.com> | 2018-07-13 16:14:37 +0000 |
commit | a97ad691465db8d768623c63e597bedaedb25619 (patch) | |
tree | 7cbf794ca01e828df4064e8e8d602aac5c0a4dc5 /lib/Analysis | |
parent | 57726810dce71720de5ab81393a6e977902fdaf2 (diff) |
[NFC][X86][AArch64] Negative tests for 'check for [no] signed truncation' pattern
See D49247, D49266
I'm only adding the sane negative tests, and not
adding the one-use tests yet. Also, not adding
negative tests for the second pattern with inverted operands yet,
since it's handling will be added in later differential.
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@337014 91177308-0d34-0410-b5e6-96231b3b80d8
Diffstat (limited to 'lib/Analysis')
0 files changed, 0 insertions, 0 deletions